Figure 3.

Representative TEM image of the P-doped Si-NCs/SiNxfilm with Rc = 0.79. The crystalline structure of Si-NCs is circled by white circles. Dashed lines indicate interfaces between the Si-NCs/SiNx film and surrounding c-Si wafer and epoxy layer.

Wu et al. Nanoscale Research Letters 2013 8:457   doi:10.1186/1556-276X-8-457
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