Figure 6.

Ex situ θ/2θ diffractograms measured for X-ray stress analysis. (a) Unpolished Cu foil, (b) polished Cu foil (400 grit), and (c) Cu film specimens before heating. The legend reports the corresponding ψ angles (i.e., inclination of the specimen).

Hu et al. Nanoscale Research Letters 2013 8:445   doi:10.1186/1556-276X-8-445
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