Figure 3.

FE-SEM images of the samples. (a) Uncalendered sample and calendered samples (b) ×2 and (c) ×15 for reference paperboard and TiO2 nanoparticle-coated samples in low and high magnifications.

Stepien et al. Nanoscale Research Letters 2013 8:444   doi:10.1186/1556-276X-8-444
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