AFM image, section analysis profile, and 3D surface morphology of the deposited graphene film. (a) An AFM image of the graphene film deposited on quartz for 3 min. (b) The section analysis profile of the red line in (a). The yellow horizontal line shows the position of measuring the film thickness. (c) 3D surface morphology of the graphene film.
Ma and Zhang Nanoscale Research Letters 2013 8:440 doi:10.1186/1556-276X-8-440