Figure 5.

Electrical properties. (a) Vertical resistivity of the Si QD-embedded ZnO thin films under different Tann. (b) Logarithmic I-V curve of the sample annealed at 700°C. The inset shows the linear I-V curve in magnification.

Kuo et al. Nanoscale Research Letters 2013 8:439   doi:10.1186/1556-276X-8-439
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