Figure 2.

Crystalline properties of ZnO matrix. (a) XRD patterns fine-scanned from 30° to 40° of the Si QD-embedded ZnO thin films under different Tann. (b) Full XRD pattern of the Si QD-embedded ZnO thin film annealed at 700°C. The inset shows the curve fitting result for the main diffraction signal.

Kuo et al. Nanoscale Research Letters 2013 8:439   doi:10.1186/1556-276X-8-439
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