Figure 2.

Different types of imaging showing different characteristics of formed WS2 nanosheets and FFT analysis. (a) TEM image of the WS2 nanosheets. (b, d) High-resolution TEM images for the selected regions are shown. (c) Two-dimensional FFT analysis for the WS2 nanosheets. (e) Tapping-mode AFM image of the WS2 nanosheets and (g) the corresponding thickness distribution. (f) High-resolution TEM image of the curled edge for the nanosheets.

Mao et al. Nanoscale Research Letters 2013 8:430   doi:10.1186/1556-276X-8-430
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