Figure 5.

SEM images of the fractured and cracked Si nanopillars. (a) Formed from the highly doped Si after etching in λ1 solution for 10 min, (b) from the lightly doped Si after etching in λ2 solution for 10 min, and (c) from the lightly doped Si after etching in λ1 solution for 10 min.

Wang et al. Nanoscale Research Letters 2013 8:42   doi:10.1186/1556-276X-8-42
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