Figure 2.

Spectral decomposition of Si 2p spectrum of Si NWs sample annealed at 500°C for 60 min. Spectral decomposition of Si 2p spectrum of Si NWs sample annealed at 500°C for 60 min, having all the relevant suboxide and silicon peaks (Si 2p3/2 in dark green and Si 2p1/2 in light green). The black line is the original spectrum, while the red graph represents the fitting curve which is sum of all of the decomposed peaks and fit well the experimentally obtained spectrum.

Bashouti et al. Nanoscale Research Letters 2013 8:41   doi:10.1186/1556-276X-8-41
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