Figure 1.

SEM (a) and AFM images (b) of Ni stamp used for injection nanomolding experiment. The period of the nanopillar array in the Ni stamp is about 700 nm and the depth is about 400 nm.

Fuh et al. Nanoscale Research Letters 2013 8:407   doi:10.1186/1556-276X-8-407
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