Figure 3.

SEM images of CoFe2O4/P(VDF-HFP) thin-films deposited on Si substrate. With cobalt ferrite fraction of 25 wt.% and film thickness of 1.5 μm. (a) Top surface view; (b) cross-sectional view.

Liu et al. Nanoscale Research Letters 2013 8:374   doi:10.1186/1556-276X-8-374
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