Figure 3.

FTIR spectra and the percentage of Si=O symmetric stretching mode for the SROEr films. FTIR spectra of the SROEr films annealed at different temperatures in N2 ambience for 30 min, the FTIR spectra of the A.D. sample is denoted by empty square and that of the annealed samples are denoted by the colored lines (red, 700°C; blue, 800°C; magenta, 900°C; violet, 1,000°C; and dark yellow, 1,150°C). A typical fitting of the FTIR spectra is provided for the A.D. sample (the fitting data is denoted by dash dot line). The sub-peaks A, B, and C represent the components from the Si-O-Si bulk, Si-O-Si surface, and Si=O symmetric stretching modes, respectively. The inset shows the percentage of the Si=O symmetric stretching mode for the SROEr films with different annealing temperatures.

Jin et al. Nanoscale Research Letters 2013 8:366   doi:10.1186/1556-276X-8-366
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