HAADF-STEM and TEM images of the SiNW with Al2O3. (a)The procedure on how to measure the HAADF-STEM image. (b) Cross-sectional HAADF-STEM image of a SiNW cut into a round slice at the bottom of the SiNW array. (c) Cross-sectional TEM image of the interface between the SiNW and Al2O3.
Kato et al. Nanoscale Research Letters 2013 8:361 doi:10.1186/1556-276X-8-361