Figure 4.

SEM images of CIS layer on TiO2 film, obtained by a solvothermal treatment. At 160°C for 12 h with different InCl3 concentration: (a,b) 0.01 M; (c,d) 0.03 M; (e,f) 0.1 M.

Chen et al. Nanoscale Research Letters 2013 8:354   doi:10.1186/1556-276X-8-354
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