Figure 1.

HRTEM images of the SROEr films with different Si excesses. (a) 11%, (b) 36%, (c) 58%, and (d) 88%. The Si NCs are indicated by white arrows. The insets display the HRTEM images of Si NCs in the SROEr films. The coalescent Si NCs can be formed in the SROEr films with high Si excess.

Jin et al. Nanoscale Research Letters 2013 8:34   doi:10.1186/1556-276X-8-34
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