Figure 4.

XRD and Raman spectroscopy of InSb NWs. (a) X-ray diffraction scan of a selected InSb NWs array sample, confirming the epitaxial relationship between InAs (111) and Si (111) substrate; (b) Raman spectroscopy measurements on InSb NWs grown on Si substrate.

Li et al. Nanoscale Research Letters 2013 8:333   doi:10.1186/1556-276X-8-333
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