Figure 4.

Endurance and retention characteristics. (a) Endurance characteristics of the twin poly-Si TFT EEPROM by FN and BBHE. (b) Retention characteristics of the twin poly-Si TFT EEPROM at 85°C by FN and BBHE.

Yeh et al. Nanoscale Research Letters 2013 8:331   doi:10.1186/1556-276X-8-331
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