Figure 9.

Simulated transmittance. (a) Magnetic field intensity of the incident beam at the entrance plane of the probe (black line) and the simulated measurement result (red line), normalized to have a unit peak value. (b) Dependence of the sensitivity gain factor achieved by having the corrugations in the probe, plotted as a function of the collection NA.

Rahomäki et al. Nanoscale Research Letters 2013 8:326   doi:10.1186/1556-276X-8-326
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