Simulated transmittance. (a) Magnetic field intensity of the incident beam at the entrance plane of the probe (black line) and the simulated measurement result (red line), normalized to have a unit peak value. (b) Dependence of the sensitivity gain factor achieved by having the corrugations in the probe, plotted as a function of the collection NA.
Rahomäki et al. Nanoscale Research Letters 2013 8:326 doi:10.1186/1556-276X-8-326