Figure 4.

Measurement configuration. A schematic configuration for characterization of the field probe, which is placed in the object plane of a scanning confocal transmission microscope. The same geometry is used to measure the profile of the incident field by scanning it across the probe.

Rahomäki et al. Nanoscale Research Letters 2013 8:326   doi:10.1186/1556-276X-8-326
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