Figure 1.

The system concept. The concept of the nanoslit-based probe for characterization of subwavelength-structured free fields. The inset shows the design parameters of the device: the aperture width w, the screen thickness h, and the thickness ht of a thin TiO2 layer as well as the period d, groove depth hm, and trench width f of the corrugations.

Rahomäki et al. Nanoscale Research Letters 2013 8:326   doi:10.1186/1556-276X-8-326
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