Images of the structure. Scanning electron microscope (SEM) and atomic force microscope (AFM) images of the structure. (a) SEM image of the Al glue interface, (b) SEM image of the entrance surface showing the slit, and (c) AFM image of the top surface, where the color bar indicates depth scale from -10 nm (black) to 10 nm (white).
Rahomäki et al. Nanoscale Research Letters 2013 8:326 doi:10.1186/1556-276X-8-326