The system concept. The concept of the nanoslit-based probe for characterization of subwavelength-structured free fields. The inset shows the design parameters of the device: the aperture width w, the screen thickness h, and the thickness ht of a thin TiO2 layer as well as the period d, groove depth hm, and trench width f of the corrugations.
Rahomäki et al. Nanoscale Research Letters 2013 8:326 doi:10.1186/1556-276X-8-326