Figure 2.

TEM images and EDS spectra of cobalt silicide nanowires. (a) Low-magnification, (b) high-resolution TEM images and (c) EDS spectrum of CoSi nanowires grown at 850°C ~ 880°C. The inset in (b) shows the corresponding selected area diffraction pattern with a zone axis of [0-11]. (d) Low-magnification, (e) high-resolution TEM images and (f) EDS spectrum of Co2Si nanowires grown at 880°C ~ 900°C. The inset in (e) shows the corresponding selected area diffraction pattern with a zone axis of [1-30].

Lu et al. Nanoscale Research Letters 2013 8:308   doi:10.1186/1556-276X-8-308
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