Reflection optical microscopy, AFM topography, and conduction images of mica flakes on semitransparent gold. (a) Reflection optical microscopy image of a staircase mica flake with thicknesses in the 37- to 277-nm range on a semitransparent gold layer. (b) AFM topography and (c) conduction images of the same area. (d) Topographic and (e) current profiles along the lines indicated in (b) and (c), respectively.
Dols-Perez et al. Nanoscale Research Letters 2013 8:305 doi:10.1186/1556-276X-8-305