Figure 5.

Line profiles extracted from the AFM images of ion-exposed samples at 70°. Various fluences: (a) 1 × 1017, (b) 2 × 1017, (c) 5 × 1017, (d) 10 × 1017, (e) 15 × 1017, and (f) 20 × 1017 ions cm-2, respectively. Arrow indicates the direction of ion beam onto the surface.

Basu et al. Nanoscale Research Letters 2013 8:289   doi:10.1186/1556-276X-8-289
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