Resolution:
standard / ## Figure 2.
Scanning electron micrographs of porous alumina. (a) Simple anodization in oxalic acid at 40 V; insert: fast Fourier transform of the
scanning electron microscopy (SEM) image. (b) Double anodization in oxalic acid at 40 V; insert: fast Fourier transform of the
SEM image. (c) Cross-sectional view before widening and opening of the pore’s end with a lattice
constant of 250 nm. (d) Top view after widening and opening of the pore’s end with a lattice constant of
100 nm; insert: fast Fourier transform of the SEM image. (e) Example of pore array obtained when only one third of the pores are localised using
nanoimprint lithography. (f) Example of non-cylindrical pore array obtained with non-equilateral triangular lattice.
Gorisse |