Figure 2.

Scanning electron micrographs of porous alumina. (a) Simple anodization in oxalic acid at 40 V; insert: fast Fourier transform of the scanning electron microscopy (SEM) image. (b) Double anodization in oxalic acid at 40 V; insert: fast Fourier transform of the SEM image. (c) Cross-sectional view before widening and opening of the pore’s end with a lattice constant of 250 nm. (d) Top view after widening and opening of the pore’s end with a lattice constant of 100 nm; insert: fast Fourier transform of the SEM image. (e) Example of pore array obtained when only one third of the pores are localised using nanoimprint lithography. (f) Example of non-cylindrical pore array obtained with non-equilateral triangular lattice.

Gorisse et al. Nanoscale Research Letters 2013 8:287   doi:10.1186/1556-276X-8-287
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