Figure 5.

Arrangement of the reference (lower left) and detected (upper right) flats in the three-intersection method. For (a) rotation axis on diagonal, (b) another diagonal, (c) line at y = 10.0 mm, and (d) line at x = 10.0 mm.

Uchikoshi et al. Nanoscale Research Letters 2013 8:275   doi:10.1186/1556-276X-8-275
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