The XRD patterns of the samples submitted to CA and RTA treatments. XRD pattern for a sample with x = 0.68 after CA treatment at 1,150°C for 30 min in nitrogen flow. The inset shows the expanded presentation of the (111) Si peak for CA and RTA samples with x = 0.68. RTA treatment was performed at 1,050°C for 1 min in nitrogen flow.
Korsunska et al. Nanoscale Research Letters 2013 8:273 doi:10.1186/1556-276X-8-273