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Resolution: standard / high Figure 2.
Calculated intensity polar patterns of scattered light and measured polarized Raman
scattering of TO phonon. (a) Calculated intensity polar patterns of the scattered light polarized perpendicular
(I⊥) or parallel (I∥) to the [111] direction as a function of the angle ϕ of the incident polarization with respect to [111] is shown for TO phonons in backscattering
from a bulk InAs (110) substrate. (b) Measured polarized Raman scattering of the TO mode on a reference bulk InAs (110)
substrate. Spheres and open squares represent the parallel and perpendicular components
of the Raman signal, respectively. The continuous line is a squared sine fit to the
data.
Li et al. Nanoscale Research Letters 2013 8:27 doi:10.1186/1556-276X-8-27 |