Calculated intensity polar patterns of scattered light and measured polarized Raman scattering of TO phonon. (a) Calculated intensity polar patterns of the scattered light polarized perpendicular (I⊥) or parallel (I∥) to the  direction as a function of the angle ϕ of the incident polarization with respect to  is shown for TO phonons in backscattering from a bulk InAs (110) substrate. (b) Measured polarized Raman scattering of the TO mode on a reference bulk InAs (110) substrate. Spheres and open squares represent the parallel and perpendicular components of the Raman signal, respectively. The continuous line is a squared sine fit to the data.
Li et al. Nanoscale Research Letters 2013 8:27 doi:10.1186/1556-276X-8-27