Figure 2.

Top-view SEM images of AAM. (a) Two-micrometer pitch AAM after the second anodization, (b) 2.5-μm-pitch AAM after the first anodization, and (c) 3-μm-pitch AAM after the first anodization, with their corresponding cross-sectional-view SEM images in the inset.

Lin et al. Nanoscale Research Letters 2013 8:268   doi:10.1186/1556-276X-8-268
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