Near-field optical signal profiles of the composite and virgin glass samples. Near-field optical signal profiles measured in contact mode for composite sample (thick lines) and virgin glass sample (thin lines) both subjected to the EFI process. The results of three different excitation wavelengths are presented. AFM profile of the composite sample surface is shown at the bottom for convenience; marks 1 to 10 correspond to the stamp groove width from 100 to 600 nm as shown in Figure 2a.
Sinev et al. Nanoscale Research Letters 2013 8:260 doi:10.1186/1556-276X-8-260