Figure 3.

XPS analyses of the Ti-Al-V-O oxide nanofilms annealed at different temperatures. (a) Deconvolution of survey spectrum and (b) Ti 2p3, (c) Al 2p, (d) V 2p3, (e) O 1s scan curves.

Li et al. Nanoscale Research Letters 2013 8:25   doi:10.1186/1556-276X-8-25
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