Figure 2.

Dependence of free carrier volume concentration in Au layer deposited on glass at different temperatures. The dependence of free carrier volume concentration in Au layer on the layer thickness measured for evaporated samples deposited on glass at RT, deposited on substrate heated to 300°C (300°C) and deposited on glass with room temperature and consequently annealed at 300°C (annealing).

Schaub et al. Nanoscale Research Letters 2013 8:249   doi:10.1186/1556-276X-8-249
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