Open Access Correction

Correction: Investigation of phase composition and nanoscale microstructure of high-energy ball-milled MgCu sample

Zongqing Ma, Yongchang Liu*, Liming Yu and Qi Cai

Author Affiliations

Tianjin Key Laboratory of Composite and Functional Materials, School of Materials Science & Engineering, Tianjin University, Tianjin 300072, P R China

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Nanoscale Research Letters 2013, 8:186  doi:10.1186/1556-276X-8-186


The electronic version of this article is the complete one and can be found online at: http://www.nanoscalereslett.com/content/8/1/186


Received:18 April 2013
Accepted:18 April 2013
Published:23 April 2013

© 2013 Ma et al.; licensee Springer.

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Correction

In the Methods section of our published article [1], the evolution of grain size and microstrain in the Mg and Cu is estimated using the single-line method of diffraction line-broadening analysis. However, a very important reference is omitted, and this method founder’s publication should be cited here [2].

Moreover, the experimental results contained in this paper were obtained by the first author in cooperation with Dr. U. Welzel, Dr. E. Bischoff and Prof. Dr. E.J. Mittemeijer (all Max Planck Institute for Intelligent Systems) during the stay of the first author in the department of Prof. Dr. Mittemeijer. Thus the authors would like to express our gratitude to them in the Acknowledgements section of this published article [1].

References

  1. Ma ZQ, Liu YC, Yu LM, Cai Q: Investigation of phase composition and nanoscale microstructure of high-energy ball-milled MgCu sample.

    Nanoscale Res Lett 2012, 7:390. PubMed Abstract | BioMed Central Full Text | PubMed Central Full Text OpenURL

  2. de Keijser TH, Langford JI, Mittemeijer EJ, Vogels ABP: Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening.

    J Appl Cryst 1982, 15:308-314. Publisher Full Text OpenURL