Figure 4.

HRTEM analysis on the Si/ZnO heterostructure NWs. TEM and HRTEM micrographs of Si/ZnO core-shell NWs prepared at different ZnO growth time of (a, b) 0.5, (c, d) 1, and (e, f) 1.5 h. Magnified HRTEM micrographs from (b) and (d) are inserted in the respective figures. FFT patterns inserted in (d) and (f) are converted from the appropriate HRTEM micrographs.

Chong et al. Nanoscale Research Letters 2013 8:174   doi:10.1186/1556-276X-8-174
Download authors' original image