Figure 2.

XRD patterns for the 250°C samples (green for the as-deposited and blue for the post-deposition annealing). The grain size of the annealed sample (9.55 nm) increased compared to the as-deposited sample (8.83 nm), which suggests that post-deposition annealing in vacuum causes an increase in the size of the crystalline grains.

Zhao et al. Nanoscale Research Letters 2013 8:172   doi:10.1186/1556-276X-8-172
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