HR-TEM micrographs of ZnO nanowires irradiated with a fluence of 1017 cm−2. Showing (a) an example of the etched surface (in this case, the removed material layer depth is about 10 nm). In (b, c), redeposited crystalline particles, with different orientations in the cross-sectional surface and the inner region of the wire, respectively, are observed.
Allah et al. Nanoscale Research Letters 2013 8:162 doi:10.1186/1556-276X-8-162