HR-TEM images of ZnO NW. (a) HR-TEM image recorded on an irradiated ZnO NW (fluence = 1017 cm−2) confirming the high crystalline quality of the nanowire; the inset shows the corresponding FFT recorded along the  zone axis. (b) HR-TEM micrograph of one individual irradiated ZnO NW (fluence = 1017 cm−2) faceted tip. The inset corresponds to the small squared region of the tip, showing the appearance of one extra plane (edge dislocation).
Allah et al. Nanoscale Research Letters 2013 8:162 doi:10.1186/1556-276X-8-162