Figure 3.

Measured hemispherical reflectance spectra and estimated average height and number of structures. (a) Measured hemispherical reflectance spectra of the Si nanostructures fabricated using different HF concentrations from 4% to 25% in an aqueous solution. (b) Estimated average height and number of structures within a unit area as a function of HF concentration.

Yeo et al. Nanoscale Research Letters 2013 8:159   doi:10.1186/1556-276X-8-159
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