Figure 2.

SEM images of the Si nanostructures and measured hemispherical reflectance spectra. (a) 45° tilted- and (b) cross-sectional-view SEM images of the Si nanostructures fabricated using different HNO3 concentrations from 10% to 22% in an aqueous solution. (c) Measured hemispherical reflectance spectra of the corresponding Si nanostructures as a function of wavelength.

Yeo et al. Nanoscale Research Letters 2013 8:159   doi:10.1186/1556-276X-8-159
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