Figure 1.

Cu concentrations within SiO2 layer along different paths. (a) HRTEM cross-sectional image of a Cu/Cu-NP embedded SiO2/Pt sample. (b) Energy-dispersive X-ray spectroscopy (EDX) result along line A-B. (c) Energy-dispersive X-ray spectroscopy (EDX) result along line C-D.

Liu et al. Nanoscale Research Letters 2013 8:156   doi:10.1186/1556-276X-8-156
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