Figure 7.

XTEM observation of quartz samples produced by a nanoscratch tester. TEM images of (a) low-destructive scanned area and (b) groove before KOH etching. TEM images of (c) low-destructive scanned area and (d) groove after KOH etching. The centre of each scanned area was marked with a white arrow. The inset pictures are the AFM images of the low-destructive scanned area and groove, respectively.

Song et al. Nanoscale Research Letters 2013 8:140   doi:10.1186/1556-276X-8-140
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