Transmission electron microscopy. TEM view of a silicon nanowire which grew in the AAO template. (a) Low-resolution view of the nanowire. (b) High-resolution picture near the apex of the nanowire. Upper inset is an FFT of the image showing the periodicity along the growth axis corresponding to the (111) planes of silicon. Lower inset presents a high-resolution view clearly displaying the (111) planes.
Dupré et al. Nanoscale Research Letters 2013 8:123 doi:10.1186/1556-276X-8-123