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Modulation in current density of metal/n-SiC contact by inserting Al₂O₃ interfacial layer

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Shan Zheng, Qing-Qing Sun^*, Wen Yang, Peng Zhou^*, Hong-Liang Lu and David Wei Zhang

* Corresponding authors: Qing-Qing Sun qqsun@fudan.edu.cn - Peng Zhou pengzhou@fudan.edu.cn

Nanoscale Research Letters 2013, 8:116 doi:10.1186/1556-276X-8-116

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