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Resolution: standard / high Figure 1.
XRD spectra. ZnO films deposited on different substrates at 400°C: (a) Si substrate and (c) GaN/Si substrate. (b) Annealed GaN thin films deposited on Si substrate.
Wei et al. Nanoscale Research Letters 2013 8:112 doi:10.1186/1556-276X-8-112 |
