Figure 4.

Bright-field HR-TEM images and EELS elemental maps. Showing the distribution of silicon (Si), oxygen (O), carbon (C), and iron (Fe) in plan views after introducing C2H2 at 900°C on silicon substrate U.

Choi et al. Nanoscale Research Letters 2013 8:110   doi:10.1186/1556-276X-8-110
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