Figure 2.

Typical XRD patterns of LZO films. (a) ω-scan pattern, (b) φ-scan pattern, and (c) pole figure of LZO films grown on CeO2 buffered NiW tapes with the texture of ∆ ω = 3.4° and ∆ φ = 5.5°.

Xu et al. Nanoscale Research Letters 2013 8:109   doi:10.1186/1556-276X-8-109
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