Figure 3.

X-ray diffraction analysis and HRTEM image. XRD plots of the R2R-grown SiON/Ag/SiON (Ag 12 nm) multilayer sputtered on a PES substrate as a function of the top and bottom SiON thickness. The inset shows the cross-sectional HRTEM image of the SiON (110 nm)/Ag (12 nm)/SiON (110 nm) multilayer.

Kim and Cho Nanoscale Research Letters 2012 7:69   doi:10.1186/1556-276X-7-69
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